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Focused Ion Beam Systems: Basics and Applications. Nan Yao

Download Focused Ion Beam Systems: Basics and Applications

Focused Ion Beam Systems: Basics and Applications Nan Yao. pdf ebook Publisher: Cambridge University Press Language: English Page: 408 ISBN: 0521831997, 9780521831994

Book Description

This edited volume comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

About the Author

NAN YAO holds several positions at Princeton University, New Jersey. He is director of the Imaging and Analysis Center; Senior Research Scholar at the Institute for the Science and Technology of Materials; and a lecturer in Mechanical and Aerospace Engineering.